Sürdürülebilir Kalkınma Amaçları

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Yazarlar

• Özen, Soner(19)
• Pat, Suat(18)
• Şenay, Volkan(17)
• Korkmaz, Şadan(15)
• Geçici, Birol(3)
• Korkmaz, Sadan(3)
• Mohammadigharehbagh, Reza(3)
• Senay, Volkan(3)
• Aydoʇmuş, Tuna(2)
• Balbaʇ, M. Zafer(2)
• Ekem, Naci(2)
• Elmas, Saliha(2)
• Akkus, B.(1)
• Anouar, Abdellah(1)
• Aydoğmuş, Tuna(1)
• Bayram, Ozkan(1)
• Dogan, G.S.(1)
• El Hassani, Kaoutar(1)
• Korkmaz, S. Deniz(1)
• Mavi, Ahmet(1)
• Mert, Merve(1)
• Mutlu, R.B.C.(1)
• Oktem, Y.(1)
• Ozen, Soner(1)
• Sarac, Mehmet Fahri(1)
• Solakyildirim, Tuba(1)
• Teber, Ahmet(1)
• Yalcin, L.S.(1)
• Yudar, H. Hakan(1)
• Yudar, Hafizittin Hakan(1)
• Şimşek, Veli(1)

• MakaleYalnız künye2015Scopus SJRQ3/r/bayburt/13703
  Some physical properties of the SiGe thin film coatings by thermionic vacuum arc (TVA)

  Özen, Soner; Pat, Suat; Şenay, Volkan; Korkmaz, Şadan; Geçici, Birol

  SiGe thin films were deposited on glass and PET substrate by the thermionic vacuum arc (TVA) method for the first time. TVA is an anodic plasma generator which works in high vacuum conditions. Highly pure and quality films can be deposited on different substrates by means of this method. In order to characterize the produced films, X-ray diffraction, field emission scanning electron microscope (FESEM), atomic force microscope (AFM), energy dispersive X-ray spectrometer (EDX), optical tensiometer, UV-Vis spectrophotometer and spectroscopic ellipsometer (SE) devices were used. The obtained XRD peaks at 47° and 75° are described to the reflections of (220) and (331) planes of Ge or Si. According to the measurement results, substrates materials are affect the surface and optical properties of the deposited SiGe layers. SiGe coated samples with low optical band gaps exhibit low transparency and high absorption. The structures are homogenous and less rough.

  AtıfScopus15·WoS16·OpenAlex14

  İncele
• BildiriYalnız künye2014Scopus SJRQ1/r/bayburt/13790
  ZnO thin film synthesis by reactive radio frequency magnetron sputtering

  Şenay, Volkan; Pat, Suat; Korkmaz, Şadan; Aydoʇmuş, Tuna; Elmas, Saliha; Özen, Soner; Ekem, Naci; Balbaʇ, M. Zafer

  In this study, ZnO thin films were deposited on glass substrates by reactive RF magnetron sputtering method at argon-oxygen gas mixing (1:1) atmosphere. Some properties of the synthesized films were investigated by interferometry, UV-vis spectrophotometer, atomic force microscopy, and tensiometer. Tauc method was adopted to estimate the optical band gaps. The band gaps of the deposited films were affected by film thickness. We concluded that the surface composition plays a substantial role in the values of the band gaps. Nanocrystalline structures were detected in all produced samples.

  AtıfScopus55·WoS49

  İncele