Investigation of the surface free energy of the ITO thin films deposited under different working pressure

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This study discusses the influence of working pressure on the surface energy of the ITO thin films produced by radio frequency magnetron sputtering method. Optical tensiometer (Attension Theta Lite) is used for evaluating wetting behavior of the water droplet on the film surface and Equation of State method was selected to determine surface free energy for this study. Equation of state method does not divide the surface tension into different components such as polar, dispersive, acid-base. It is calculated the surfaces' free energy measuring the contact angle with a single liquid. The surface free energy value was in the range of 15-31 mN/m. Also, the transmittances were determined in the wavelength range between 200 and 1000 nm using the UNICO 4802 UV-Vis double beam spectrophotometer. Transmittances of the produced ITO thin films are greater than %70 in the visible range.

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https://rdlopen.rawdatalibrary.net/r/bayburt/13741Resmi atıflarda kullanılan kalıcı adres
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https://doi.org/10.1063/1.4944296Yayıncı resmi DOI adresi
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AlanDeğerDil
dc.contributor.authorÖzen, Soner
dc.contributor.authorŞenay, Volkan
dc.contributor.authorPat, Suat
dc.contributor.authorKorkmaz, Şadan
dc.contributor.editorAkkus, B.
dc.contributor.editorDogan, G.S.
dc.contributor.editorMutlu, R.B.C.
dc.contributor.editorYalcin, L.S.
dc.contributor.editorOktem, Y.
dc.date.accessioned2026-10-29T19:11:23.692524350Z
dc.date.available2026-10-29T19:11:23.692524350Z
dc.date.issued2016
dc.description.abstractThis study discusses the influence of working pressure on the surface energy of the ITO thin films produced by radio frequency magnetron sputtering method. Optical tensiometer (Attension Theta Lite) is used for evaluating wetting behavior of the water droplet on the film surface and Equation of State method was selected to determine surface free energy for this study. Equation of state method does not divide the surface tension into different components such as polar, dispersive, acid-base. It is calculated the surfaces' free energy measuring the contact angle with a single liquid. The surface free energy value was in the range of 15-31 mN/m. Also, the transmittances were determined in the wavelength range between 200 and 1000 nm using the UNICO 4802 UV-Vis double beam spectrophotometer. Transmittances of the produced ITO thin films are greater than %70 in the visible range.
dc.description.sponsorshipTürkiye Bilimsel ve Teknolojik Araştirma Kurumu, TÜBITAK, (115E331)
dc.identifier.articlenumber290010
dc.identifier.doi10.1063/1.4944296
dc.identifier.isbn978-073541369-6
dc.identifier.issn0094-243X
dc.identifier.scopus2-s2.0-84984540737
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/bayburt/13741
dc.identifier.volume1722
dc.identifier.wosWOS:000375923300177
dc.language.isoen
dc.publisherAmerican Institute of Physics Inc.
dc.relation.conference9th International Physics Conference of the Balkan Physical Union, BPU 2015
dc.relation.ispartofAIP Conference Proceedings
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subject.classificationPhysics, Applied
dc.subject.classificationPhysics
dc.subject.otherLIGHT-EMITTING-DIODES
dc.subject.otherTRANSPARENT
dc.subject.otherEVAPORATION
dc.titleInvestigation of the surface free energy of the ITO thin films deposited under different working pressure
dc.typeConference Object
rdl.citation.openalex1
rdl.citation.scopus1
rdl.citation.wos1
rdl.conference.date24 August 2015 through 27 August 2015
rdl.conference.placeIstanbul
rdl.oa.statusclosed
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexConference Proceedings Citation Index - Science (CPCI-S)