The surface morphology research of the BGaN thin films deposited by thermionic vacuum arc

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In this paper, BGaN thin films with two different thicknesses were deposited on two different substrates and their surface morphologies were investigated. The amorphous glass and semi-crystalline polyethylene terephthalate substrates were selected. At the same time, two different deposition angles are selected with a view to the effect of deposition angle on surface morphology. The surface and optical properties were determined by using X-ray diffractometer (XRD), atomic force microscope (AFM), spectroscopic ellipsometry (SE) and optical interferometer. The thicknesses of thin films on substrates are about 30 nm and 40 nm. According to the atomic force microscope images, small-dimensional grains observed on relatively large grains. The roughness values of the thin films on the polyethylene terephthalate substrate are lower than on the glass substrate.

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AlanDeğerDil
dc.contributor.authorÖzen, Soner
dc.contributor.authorPat, Suat
dc.contributor.authorŞenay, Volkan
dc.contributor.authorKorkmaz, Şadan
dc.date.accessioned2026-10-29T19:09:27.838539895Z
dc.date.available2026-10-29T19:09:27.838539895Z
dc.date.issued2017
dc.description.abstractIn this paper, BGaN thin films with two different thicknesses were deposited on two different substrates and their surface morphologies were investigated. The amorphous glass and semi-crystalline polyethylene terephthalate substrates were selected. At the same time, two different deposition angles are selected with a view to the effect of deposition angle on surface morphology. The surface and optical properties were determined by using X-ray diffractometer (XRD), atomic force microscope (AFM), spectroscopic ellipsometry (SE) and optical interferometer. The thicknesses of thin films on substrates are about 30 nm and 40 nm. According to the atomic force microscope images, small-dimensional grains observed on relatively large grains. The roughness values of the thin films on the polyethylene terephthalate substrate are lower than on the glass substrate.
dc.description.sponsorshipScientific Research Projects Commission of Eskişehir Osmangazi University, (201619A218)
dc.identifier.doi10.1016/j.vacuum.2016.10.033
dc.identifier.endpage54
dc.identifier.issn0042-207X
dc.identifier.scopus2-s2.0-84993995159
dc.identifier.startpage50
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/bayburt/12341
dc.identifier.volume135
dc.identifier.wosWOS:000390518800008
dc.language.isoen
dc.publisherElsevier Ltd
dc.relation.ispartofVacuum
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectGaN thin film
dc.subjectRefractive index
dc.subjectSurface properties
dc.subjectThermionic vacuum arc
dc.subjectXRD
dc.subject.classificationMaterials Science, Multidisciplinary
dc.subject.classificationPhysics, Applied
dc.subject.classificationMaterials Science
dc.subject.classificationPhysics
dc.subject.otherAtomic force microscopy
dc.subject.otherDeposition
dc.subject.otherGlass
dc.subject.otherMorphology
dc.subject.otherOptical properties
dc.subject.otherPlastic bottles
dc.subject.otherPolyethylene terephthalates
dc.subject.otherRefractive index
dc.subject.otherSpectroscopic ellipsometry
dc.subject.otherSubstrates
dc.subject.otherSurface morphology
dc.subject.otherSurface properties
dc.subject.otherVacuum applications
dc.subject.otherVacuum technology
dc.subject.otherAtomic force microscope images
dc.subject.otherDeposition angle
dc.subject.otherDifferent substrates
dc.subject.otherGaN thin films
dc.subject.otherOptical interferometer
dc.subject.otherSemicrystallines
dc.subject.otherThermionic vacuum arc
dc.subject.otherX ray diffractometers
dc.subject.otherThin films
dc.titleThe surface morphology research of the BGaN thin films deposited by thermionic vacuum arc
dc.typeArticle
rdl.citation.openalex10
rdl.citation.scopus10
rdl.citation.wos9
rdl.oa.statusclosed
rdl.scopus.quartileQ2
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)