Optical, morphological and nano-mechanical properties of chromium oxide thin films fabricated by radio frequency (RF) magnetron sputtering

MakaleAçık ErişimScopus SJRQ2

Özet

In this research, two transparent chromium oxide thin films having different thickness values were simultaneously deposited on glass substrates by adjusting target-substrate distance by means of radio frequency (RF) magnetron sputtering technique. The effect of film thickness on optical, morphological and nano-mechanical properties of the produced thin films were analyzed by using UV-VIS spectrophotometer, interferometer, tensiometer and atomic force microscope. The transmittance and absorbance of the films were measured in the incident photon wavelength range of 300–1000 nm. The optical energy band gap value of the produced thin films was estimated to be approximately 4 eV from the obtained absorbance data via Tauc's method. According to the results obtained from nano-mechanical tests, the produced thin films were highly scratch resistant. From the wetting experiments, it was found that the surfaces of the films were hydrophilic.

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https://rdlopen.rawdatalibrary.net/r/bayburt/13524Resmi atıflarda kullanılan kalıcı adres
DOI
https://doi.org/10.1016/j.ijleo.2019.163433Yayıncı resmi DOI adresi
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Scopus
11
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10
OpenAlex
11
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Tam Kayıt
AlanDeğerDil
dc.contributor.authorÖzen, Soner
dc.contributor.authorŞenay, Volkan
dc.date.accessioned2026-10-29T19:11:05.938308762Z
dc.date.available2026-10-29T19:11:05.938308762Z
dc.date.issued2020
dc.description.abstractIn this research, two transparent chromium oxide thin films having different thickness values were simultaneously deposited on glass substrates by adjusting target-substrate distance by means of radio frequency (RF) magnetron sputtering technique. The effect of film thickness on optical, morphological and nano-mechanical properties of the produced thin films were analyzed by using UV-VIS spectrophotometer, interferometer, tensiometer and atomic force microscope. The transmittance and absorbance of the films were measured in the incident photon wavelength range of 300–1000 nm. The optical energy band gap value of the produced thin films was estimated to be approximately 4 eV from the obtained absorbance data via Tauc's method. According to the results obtained from nano-mechanical tests, the produced thin films were highly scratch resistant. From the wetting experiments, it was found that the surfaces of the films were hydrophilic.
dc.identifier.articlenumber163433
dc.identifier.doi10.1016/j.ijleo.2019.163433
dc.identifier.eissn1618-1336
dc.identifier.issn0030-4026
dc.identifier.scopus2-s2.0-85073057209
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/bayburt/13524
dc.identifier.volume201
dc.identifier.wosWOS:000506318200035
dc.language.isoen
dc.publisherElsevier GmbH
dc.relation.ispartofOptik
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectChromium oxide
dc.subjectMechanical properties
dc.subjectMorphological properties
dc.subjectOptical properties
dc.subjectRF magnetron sputtering
dc.subjectThin film
dc.subject.classificationOptics
dc.subject.otherAtomic force microscopy
dc.subject.otherChromium compounds
dc.subject.otherEnergy gap
dc.subject.otherMagnetron sputtering
dc.subject.otherMechanical properties
dc.subject.otherOptical properties
dc.subject.otherOxide films
dc.subject.otherRadio waves
dc.subject.otherScratch resistance
dc.subject.otherSubstrates
dc.subject.otherThin films
dc.subject.otherChromium oxides
dc.subject.otherMorphological properties
dc.subject.otherNanomechanical property
dc.subject.otherOptical energy band gap
dc.subject.otherRadio frequency magnetron sputtering
dc.subject.otherrf-Magnetron sputtering
dc.subject.otherTarget-substrate distance
dc.subject.otherUV-Vis spectrophotometers
dc.subject.otherOptical films
dc.titleOptical, morphological and nano-mechanical properties of chromium oxide thin films fabricated by radio frequency (RF) magnetron sputtering
dc.typeArticle
rdl.citation.openalex11
rdl.citation.scopus11
rdl.citation.wos10
rdl.oa.statusclosed
rdl.oa.statusgreen
rdl.oa.urlhttp://hdl.handle.net/20.500.12403/3537
rdl.scopus.quartileQ2
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)