The structural, optical, topographical, and H2 sensing characteristics of a Zn-doped Fe2O3 thin layer deposited via DC & RF magnetron co-sputtering method

MakaleAçık ErişimScopus SJRQ2

Özet

In this study, a Zn-doped iron oxide layer was deposited onto a microscope slide using the magnetron co-sputtering technique with direct current (DC) and radio frequency (RF) sources. We comprehensively characterized the resulting Zn-doped Fe2O3 thin layer, employing techniques such as XRD, Raman spectroscopy, UV–VIS spectrophotometry, SEM, EDX, & AFM. XRD examination showed the nanocrystalline structure in the thin layer under investigation. Based on recorded absorption data, the band gap energy value calculation resulted in a value of 2.23 eV for the thin film. Raman spectroscopy identified peaks possessing Raman shifts from 100 to 1400 cm−1. SEM investigation illustrated a consistently uniform thin film surface characteristic throughout the substrate. Additionally, the AFM study disclosed a small RMS roughness value, indicative of an unrough surface for the Zn: Fe2O3 thin layer. The Fe2O3 thin film doped with Zn employing a 30 W DC voltage demonstrated effective hydrogen sensing capability at 300 °C, achieving notable response and recovery time. This work presents a novel application of Zn-doped Fe2O3 thin films as highly sensitive and stable hydrogen sensors, tailored for high-temperature environments. The unique combination of nanocrystalline structure and Zn doping optimizes the material’s electronic properties, enhancing its responsiveness to hydrogen gas. This approach offers a scalable, cost-effective pathway for developing advanced sensor technologies suited to environmental monitoring, industrial safety, and hazardous gas detection, making it a valuable addition to the field of gas-sensing materials.

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DOI
https://doi.org/10.1007/s10854-024-14166-zYayıncı resmi DOI adresi
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Scopus
19
WoS
19
OpenAlex
11
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Tam Kayıt
AlanDeğerDil
dc.contributor.authorMerhan Muğlu, Günay
dc.contributor.authorŞenay, Volkan
dc.contributor.authorSaritaş, Sevda
dc.contributor.authorAbdolahpour Salari, Maryam
dc.contributor.authorKundakçi, Mutlu
dc.date.accessioned2026-10-29T19:08:15.527410992Z
dc.date.available2026-10-29T19:08:15.527410992Z
dc.date.issued2025
dc.description.abstractIn this study, a Zn-doped iron oxide layer was deposited onto a microscope slide using the magnetron co-sputtering technique with direct current (DC) and radio frequency (RF) sources. We comprehensively characterized the resulting Zn-doped Fe2O3 thin layer, employing techniques such as XRD, Raman spectroscopy, UV–VIS spectrophotometry, SEM, EDX, & AFM. XRD examination showed the nanocrystalline structure in the thin layer under investigation. Based on recorded absorption data, the band gap energy value calculation resulted in a value of 2.23 eV for the thin film. Raman spectroscopy identified peaks possessing Raman shifts from 100 to 1400 cm−1. SEM investigation illustrated a consistently uniform thin film surface characteristic throughout the substrate. Additionally, the AFM study disclosed a small RMS roughness value, indicative of an unrough surface for the Zn: Fe2O3 thin layer. The Fe2O3 thin film doped with Zn employing a 30 W DC voltage demonstrated effective hydrogen sensing capability at 300 °C, achieving notable response and recovery time. This work presents a novel application of Zn-doped Fe2O3 thin films as highly sensitive and stable hydrogen sensors, tailored for high-temperature environments. The unique combination of nanocrystalline structure and Zn doping optimizes the material’s electronic properties, enhancing its responsiveness to hydrogen gas. This approach offers a scalable, cost-effective pathway for developing advanced sensor technologies suited to environmental monitoring, industrial safety, and hazardous gas detection, making it a valuable addition to the field of gas-sensing materials.
dc.description.sponsorshipTürkiye Bilimsel ve Teknolojik Araştırma Kurumu, TÜBİTAK
dc.identifier.articlenumber105
dc.identifier.doi10.1007/s10854-024-14166-z
dc.identifier.eissn1573-482X
dc.identifier.issn0957-4522
dc.identifier.issue2
dc.identifier.scopus2-s2.0-85214439725
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/bayburt/11311
dc.identifier.volume36
dc.identifier.wosWOS:001393053800007
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science: Materials in Electronics
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subject.classificationEngineering, Electrical & Electronic
dc.subject.classificationMaterials Science, Multidisciplinary
dc.subject.classificationPhysics, Applied
dc.subject.classificationPhysics, Condensed Matter
dc.subject.classificationEngineering
dc.subject.classificationMaterials Science
dc.subject.classificationPhysics
dc.subject.otherAtomic emission spectroscopy
dc.subject.otherChemical sensors
dc.subject.otherDoping (additives)
dc.subject.otherEpitaxial growth
dc.subject.otherGallium compounds
dc.subject.otherGas hazards
dc.subject.otherHard facing
dc.subject.otherLayered semiconductors
dc.subject.otherMagnetron sputtering
dc.subject.otherMagnetrons
dc.subject.otherSelenium compounds
dc.subject.otherZinc alloys
dc.subject.otherZinc compounds
dc.subject.otherCurrent frequency
dc.subject.otherDirect-current
dc.subject.otherNano-crystalline structures
dc.subject.otherNanocrystalline structures
dc.subject.otherOptical-
dc.subject.otherSensing characteristics
dc.subject.otherThin layers
dc.subject.otherThin-films
dc.subject.otherXRD
dc.subject.otherZn-doped
dc.subject.otherNanocrystals
dc.titleThe structural, optical, topographical, and H2 sensing characteristics of a Zn-doped Fe2O3 thin layer deposited via DC & RF magnetron co-sputtering method
dc.typeArticle
rdl.citation.openalex11
rdl.citation.scopus19
rdl.citation.wos19
rdl.oa.statushybrid
rdl.oa.urlhttps://link.springer.com/content/pdf/10.1007/s10854-024-14166-z.pdf
rdl.scopus.quartileQ2
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)