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- MakaleAçık Erişim2022Scopus SJRQ1Broadband, Stable, and Noniterative Dielectric Constant Measurement of Low-Loss Dielectric Slabs Using a Frequency-Domain Free-Space Method
Hasar, Ugur C.; Kaya, Yunus; Ozturk, Gokhan; Ertugrul, Mehmet; Korasli, Celal
A broadband, stable, and noniterative free-space method is proposed for dielectric constant ϵr′ determination of low-loss dielectric slabs from reflection-only measurements through simple calibration standards (reflect and air). It is applicable for dispersive samples and does not require thickness information. Simulations of nondisperive and dispersive samples are performed to validate our method. Dielectric constant measurements of polyethylene and polyoxymethylene samples (9-11 GHz) are carried out to examine the accuracy of our method.
AtıfScopus41WoS37OpenAlex35
İncele - MakaleYalnız künye2022Scopus SJRQ1Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements
Hasar, Ugur Cem; Kaya, Yunus; Ozturk, Hamdullah; Izginli, Mucahit; Barroso, Joaquim Jose; Ramahi, Omar M.; Ertugrul, Mehmet
A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.
AtıfScopus48WoS42OpenAlex43İncele - MakaleAçık Erişim2021Scopus SJRQ1Parameter Retrieval of Samples on a Substrate from Reflection-Only Waveguide Measurements
Hasar, Ugur Cem; Ozturk, Hamdullah; Kaya, Yunus; Izginli, Mucahit; Ertugrul, Mehmet
A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air-and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.
AtıfScopus5WoS5OpenAlex3İncele