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Parameter Retrieval of Samples on a Substrate from Reflection-Only Waveguide Measurements

MakaleAçık ErişimScopus SJRQ1

Özet

A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air-and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.

Anahtar Kelimeler

Complex permeabilitycomplex permittivityknown substratenoniterativereflection-only
RDL Kalıcı Bağlantı (PID)
https://rdlopen.rawdatalibrary.net/r/bayburt/13384Resmi atıflarda kullanılan kalıcı adres
DOI
https://doi.org/10.1109/lmwc.2020.3046697Yayıncı resmi DOI adresi
İndeks kayıtları
ScopusScopusWeb of ScienceWeb of Science
Kaydın indeks veri tabanlarındaki sayfası (aktarımda alınan kayıt numarasıyla). Erişim, indeksin kendi koşullarına bağlıdır.
Atıflar
Scopus
5
WoS
5
OpenAlex
3
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Tam Kayıt
AlanDeğerDil
dc.contributor.authorHasar, Ugur Cem
dc.contributor.authorOzturk, Hamdullah
dc.contributor.authorKaya, Yunus
dc.contributor.authorIzginli, Mucahit
dc.contributor.authorErtugrul, Mehmet
dc.date.accessioned2026-10-29T19:10:53.145096411Z
dc.date.available2026-10-29T19:10:53.145096411Z
dc.date.issued2021
dc.description.abstractA microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air-and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.
dc.identifier.articlenumber9316699
dc.identifier.doi10.1109/lmwc.2020.3046697
dc.identifier.eissn1558-1764
dc.identifier.endpage323
dc.identifier.issn1531-1309
dc.identifier.issue3
dc.identifier.scopus2-s2.0-85099534466
dc.identifier.startpage320
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/bayburt/13384
dc.identifier.volume31
dc.identifier.wosWOS:000629021700024
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofIEEE Microwave and Wireless Components Letters
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectComplex permeability
dc.subjectcomplex permittivity
dc.subjectknown substrate
dc.subjectnoniterative
dc.subjectreflection-only
dc.subject.classificationEngineering, Electrical & Electronic
dc.subject.classificationEngineering
dc.subject.otherScattering parameters
dc.subject.otherSensitivity analysis
dc.subject.otherWaveguides
dc.subject.otherConstitutive parameters
dc.subject.otherMicrowave methods
dc.subject.otherNon-iterative
dc.subject.otherParameter retrieval
dc.subject.otherPort measurements
dc.subject.otherS-Parameter measurements
dc.subject.otherWaveguide measurements
dc.subject.otherX bands
dc.subject.otherParameter estimation
dc.titleParameter Retrieval of Samples on a Substrate from Reflection-Only Waveguide Measurements
dc.typeArticle
rdl.citation.openalex3
rdl.citation.scopus5
rdl.citation.wos5
rdl.oa.statusgreen
rdl.oa.statuspreprint
rdl.oa.urlhttps://doi.org/10.1109/LMWC.2020.3046697
rdl.scopus.quartileQ1
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)