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- MakaleAçık Erişim2026Scopus SJRQ1Permittivity Extraction of Electrically Thin Samples by Reflection-Only Free-Space Measurements
Hasar, Ugur C.; Xue, Bing; Ozturk, Hamdullah; Kaya, Yunus; Ozturk, Gokhan
A permittivity extraction procedure is devised for electrically thin samples from reflection-only free-space measurements. Unlike previous studies, this procedure relies on sample-back metal termination measurements especially useful for thinner samples. An objective function independent of antenna transmission characteristics and reference plane position is derived. Minimum and maximum thickness and permittivity values for which our method is applicable are also examined. Free-space measurements at X-band (8.2-12.4 GHz) of a Rogers 4350B sample (approx 1.52 mm) and a FR4 sample (1.60 mm) were performed to validate our method with a dielectric constant less than 5% variation.
AtıfScopus1WoS1
İncele - MakaleYalnız künye2026Scopus SJRQ1Reference-Invariant Permittivity Determination of Low-Loss Solid Dielectric Samples Using Spectral Free-Space Measurements Without Prior Thickness
Hasar, Ugur C.; Ali, Husain; Kaya, Yunus
An extraction method has been proposed for relative permittivity determination εrs of low-loss solid dielectric samples using free-space measurements. It relies on a reference-plane invariant expression with no thickness information a priori, making resistant to conventional free-space measurement errors which may arise from improper information of sample position and thickness. In addition, the method constructed by the state transition matrix (STM) uses closed-form expressions – a feature distinguishes our method from previous STM-based extraction methods requiring a numerical tool or optimization procedure. Furthermore, provided that the sample thickness L is evaluated, as a by-product, first using the derived closed-form objective function away from any thickness-resonance region, the proposed method then determines εrs and L free from thickness-resonance effect, which otherwise can introduce ripples around or at the thickness-resonance frequency. Numerical analysis is performed to validate and assess the performance of our method. Free-space measurements at X-band of two low-loss samples with substantial thickness are performed for validation and accuracy comparison of our method against other similar methods.
- MakaleAçık Erişim2022Scopus SJRQ1Calibration-Free Time-Domain Free-Space Permittivity Extraction Technique
Hasar, Ugur C.; Ozturk, Gokhan; Kaya, Yunus; Ertugrul, Mehmet
A time-domain free-space technique has been proposed to extract relative permittivity ( _r ) and effective conductivity ( σ _e ) of low-loss dielectric samples using their metal- and air-backed calibration-free reflected powers. Numerical computations and 3-D electromagnetic simulations were performed to validate the method. A sensitivity analysis was carried out to examine its accuracy. Calibration-free time-domain free-space measurements over 1-12 GHz were conducted by VNA to extract _r and σ _e of polyethylene and polypropylene low-loss samples.
AtıfScopus29WoS28OpenAlex29İncele - MakaleAçık Erişim2022Scopus SJRQ1Broadband, Stable, and Noniterative Dielectric Constant Measurement of Low-Loss Dielectric Slabs Using a Frequency-Domain Free-Space Method
Hasar, Ugur C.; Kaya, Yunus; Ozturk, Gokhan; Ertugrul, Mehmet; Korasli, Celal
A broadband, stable, and noniterative free-space method is proposed for dielectric constant ϵr′ determination of low-loss dielectric slabs from reflection-only measurements through simple calibration standards (reflect and air). It is applicable for dispersive samples and does not require thickness information. Simulations of nondisperive and dispersive samples are performed to validate our method. Dielectric constant measurements of polyethylene and polyoxymethylene samples (9-11 GHz) are carried out to examine the accuracy of our method.
AtıfScopus41WoS37OpenAlex35İncele - MakaleAçık Erişim2022Scopus SJRQ1Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements
Hasar, Ugur Cem; Kaya, Yunus; Ozturk, Hamdullah; Izginli, Mucahit; Ertugrul, Mehmet; Barroso, Joaquim Jose; Ramahi, Omar M.
A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.
AtıfScopus49WoS36OpenAlex44İncele - MakaleYalnız künye2022Scopus SJRQ1Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements
Hasar, Ugur Cem; Kaya, Yunus; Ozturk, Hamdullah; Izginli, Mucahit; Barroso, Joaquim Jose; Ramahi, Omar M.; Ertugrul, Mehmet
A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.
AtıfScopus48WoS42OpenAlex43İncele