Yazarlar

• Barroso, Joaquim Jose(1)
• Ertugrul, Mehmet(1)
• Hasar, Ugur Cem(1)
• Izginli, Mucahit(1)
• Kaya, Yunus(1)
• Ozturk, Hamdullah(1)
• Ramahi, Omar M.(1)

• MakaleAçık Erişim2022Scopus SJRQ1/r/bayburt/10799
  Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

  Hasar, Ugur Cem; Kaya, Yunus; Ozturk, Hamdullah; Izginli, Mucahit; Ertugrul, Mehmet; Barroso, Joaquim Jose; Ramahi, Omar M.

  A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.

  AtıfScopus49·WoS36·OpenAlex44

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