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- MakaleAçık Erişim2018Scopus SJRQ2A study on the optical, chemical and dielectric properties of PPCIN thin films derived from essential oil compounds using RF plasma polymerisation technique
Bayram, Ozkan; Simsek, Onder
Polymer-based nanostructured films were produced on various substrates using Radio Frequency (RF) plasma polymerization technique from Cinnamaldehyde monomer which is an organic compound. To fabricate polymer thin film, the pressure, the deposition time and RF power were set to 480 mTorr, 30 min and 15, 20 and 30 W, respectively. The effect of RF power on the optical, morphological and chemical properties of thin films were investigated. The optical, morphological and chemical properties were determined by UV–Vis spectroscopy, Atomic Force Microscopy (AFM) and FTIR spectroscopy, respectively. The average surface roughness of thin films was detected as 5.7 nm, 3.9 nm and 11.7 nm using AFM depending on the increase in RF power. Using FTIR spectroscopy, the chemical structure of the polymer thin films was compared with that of the monomer material, and it was found that the majority of the functional groups belonging to the monomers also appeared in the thin films. Optical band gap of thin films increased with RF power and these values were determined as 2.83 eV, 3.05 eV and 2.98 eV, respectively. The extinction coefficients and refractive indices of the thin films were measured at 500 nm between 0.00183–0.00522 and 2.40–2.78, respectively.
AtıfScopus14WoS14OpenAlex16İncele
- MakaleAçık Erişim2015Scopus SJRQ3Influence of RF power on optical and surface properties of the ZnO thin films deposited by magnetron sputtering
Pat, Suat; Şenay, Volkan; Özen, Soner; Korkmaz, Şadan; Geçici, Birol
The influences of the effects of sputtering power on the optical and structural properties of ZnO thin films were investigated. The ZnO layers were deposited on glass slides by RF magnetron sputtering. RF sputtering powers were adjust to 150 W and 250 W. Optical analysis and tools and methods were used for the comparison of the optical and surface properties. The results show that sputtering powers have affected the optical and surface properties. The band gap variations of ZnO thin films are observed. The samples are transparent. The roughness values of sample grown at 250 W are increased threefold in comparison with sample grown at 150 W while RF power is increased. Furthermore, surface contact angle was decreased to one-half of its values obtained at low RF power. This value is close to theoretical limit of contact angle. Obtained results show that surface properties of the layers can changed by RF power, but optical properties are slightly different.
AtıfScopus5WoS6OpenAlex6İncele
