Yazarlar

• Barroso, Joaquim Jose(1)
• Ertugrul, Mehmet(1)
• Hasar, Ugur Cem(1)
• Izginli, Mucahit(1)
• Kaya, Yunus(1)
• Ozturk, Hamdullah(1)
• Ramahi, Omar M.(1)

• MakaleYalnız künye2022Scopus SJRQ1/r/bayburt/10787
  Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements

  Hasar, Ugur Cem; Kaya, Yunus; Ozturk, Hamdullah; Izginli, Mucahit; Barroso, Joaquim Jose; Ramahi, Omar M.; Ertugrul, Mehmet

  A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.

  AtıfScopus48·WoS42·OpenAlex43

  İncele