Yazarlar

• Ertugrul, Mehmet(1)
• Hasar, Ugur Cem(1)
• Izginli, Mucahit(1)
• Kaya, Yunus(1)
• Ozturk, Hamdullah(1)

• MakaleAçık Erişim2021Scopus SJRQ1/r/bayburt/13384
  Parameter Retrieval of Samples on a Substrate from Reflection-Only Waveguide Measurements

  Hasar, Ugur Cem; Ozturk, Hamdullah; Kaya, Yunus; Izginli, Mucahit; Ertugrul, Mehmet

  A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air-and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.

  AtıfScopus5·WoS5·OpenAlex3

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