Hasar, Ugur Cem; Ozturk, Hamdullah; Kaya, Yunus; Izginli, Mucahit; Ertugrul, Mehmet

A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air-and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.

AtıfScopus5·WoS5·OpenAlex3

İncele

Hasar, Ugur C.; Ozturk, Gokhan; Barroso, Joaquim J.; Gurbuz, Tolga U.; Kaya, Yunus; Ertugrul, Mehmet

A graphical method is extended to and applied for visual inspection of solution patterns (region of complex natural frequencies sₙ) in the complexs-plane for dispersive materials characterized by the Debye and Lorentz models. These patterns are in the form of exponential decay and C-shaped profiles for the Debye and Lorentz models, respectively. Their forms are observed to be affected (e.g., moving left/right) in different manners with a variation of dispersion parameters. This method, thanks to its visual inspection capability, can help in analyzing/synthesizing filters and frequency-selective surfaces.

AtıfScopus6·WoS6·OpenAlex7

İncele