Parameter extraction method for reflection-asymmetric bianisotropic metamaterial slabs using one-port measurements
Özet
An effective microwave method is developed for extracting electromagnetic properties of bianisotropic metamaterial (MM) slabs. As a non-iterative method, it utilizes only the one-port (air-backed and metal-backed MM slab) scattering (S-) parameter measurements. This is a useful feature especially for vector network analyzers, such as MS46131A, MS46121B, and R60, performing only one-port S-parameter measurements. Electromagnetic properties of a bianisotropic MM slab formed by C-shaped resonators are measured by an X-band (8.2–12.4 GHz) rectangular waveguide setup. The effect of any gap between the short-circuit termination for metal-backed measurements and the end of the MM slab on extracted electromagnetic properties is also examined for evaluating the possible error for proposed method.
Anahtar Kelimeler
- Scopus
- 3
- WoS
- 3
- OpenAlex
- 5
Tam Kayıt
| Alan | Değer | Dil |
|---|---|---|
| dc.contributor.author | Hasar, Ugur Cem | |
| dc.contributor.author | Kaya, Yunus | |
| dc.contributor.author | Ozturk, Hamdullah | |
| dc.contributor.author | Ertugrul, Mehmet | |
| dc.contributor.author | Ramahi, Omar Mustafa | |
| dc.date.accessioned | 2026-10-29T19:08:54.459536558Z | |
| dc.date.available | 2026-10-29T19:08:54.459536558Z | |
| dc.date.issued | 2023 | |
| dc.description.abstract | An effective microwave method is developed for extracting electromagnetic properties of bianisotropic metamaterial (MM) slabs. As a non-iterative method, it utilizes only the one-port (air-backed and metal-backed MM slab) scattering (S-) parameter measurements. This is a useful feature especially for vector network analyzers, such as MS46131A, MS46121B, and R60, performing only one-port S-parameter measurements. Electromagnetic properties of a bianisotropic MM slab formed by C-shaped resonators are measured by an X-band (8.2–12.4 GHz) rectangular waveguide setup. The effect of any gap between the short-circuit termination for metal-backed measurements and the end of the MM slab on extracted electromagnetic properties is also examined for evaluating the possible error for proposed method. | |
| dc.description.sponsorship | Türkiye Bilimsel ve Teknolojik Araştırma Kurumu, TÜBİTAK | |
| dc.identifier.articlenumber | 112625 | |
| dc.identifier.doi | 10.1016/j.measurement.2023.112625 | |
| dc.identifier.eissn | 1873-412X | |
| dc.identifier.issn | 0263-2241 | |
| dc.identifier.scopus | 2-s2.0-85148699041 | |
| dc.identifier.uri | https://rdlopen.rawdatalibrary.net/r/bayburt/11872 | |
| dc.identifier.volume | 211 | |
| dc.identifier.wos | WOS:000948060200001 | |
| dc.language.iso | en | |
| dc.publisher | Elsevier B.V. | |
| dc.relation.ispartof | Measurement: Journal of the International Measurement Confederation | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.subject | Bianisotropic material | |
| dc.subject | Material characterization | |
| dc.subject | One-port | |
| dc.subject | Reflection measurements | |
| dc.subject.classification | Engineering, Multidisciplinary | |
| dc.subject.classification | Instruments & Instrumentation | |
| dc.subject.classification | Engineering | |
| dc.subject.other | Electric network analyzers | |
| dc.subject.other | Extraction | |
| dc.subject.other | Iterative methods | |
| dc.subject.other | Parameter estimation | |
| dc.subject.other | Parameter extraction | |
| dc.subject.other | Scattering parameters | |
| dc.subject.other | Bianisotropic material | |
| dc.subject.other | Bianisotropic metamaterials | |
| dc.subject.other | Electromagnetic properties | |
| dc.subject.other | Materials characterization | |
| dc.subject.other | Microwave methods | |
| dc.subject.other | One-port | |
| dc.subject.other | Parameter-extraction method | |
| dc.subject.other | Port measurements | |
| dc.subject.other | Reflection measurements | |
| dc.subject.other | S-Parameter measurements | |
| dc.subject.other | Metamaterials | |
| dc.title | Parameter extraction method for reflection-asymmetric bianisotropic metamaterial slabs using one-port measurements | |
| dc.type | Article | |
| rdl.citation.openalex | 5 | |
| rdl.citation.scopus | 3 | |
| rdl.citation.wos | 3 | |
| rdl.oa.status | closed | |
| rdl.scopus.quartile | Q1 | |
| rdl.source.index | SCOPUS | |
| rdl.source.index | WOS | |
| rdl.wos.index | Science Citation Index Expanded (SCI-EXPANDED) |
