Propagation constant measurements of reflection-asymmetric and nonreciprocal microwave networks from S-parameters without using a reflective standard

MakaleAçık ErişimScopus SJRQ1

Özet

We propose a simple method for determination of forward and backward propagation constants of nonreciprocal uniform networks or lines with asymmetric reflections. The wave cascading matrix presentation is used to diagonalize and decompose the line in terms of impedance and amplitude/phase transitions. The proposed method uses scattering parameters of the line/network connection and the thru connection, thus eliminating errors arising from fabrication tolerance and thickness of the second line. Besides, compared with conventional methods which necessitate calibration techniques such as the thru-reflect-line, our method has the advantage that it determines propagation constants without resorting the measurement of any reciprocal reflective standard. Propagation constant measurements of a reciprocal network (different-length X-band waveguide straights) and a nonreciprocal network (microwave phase shifter) were first carried out and then compared with those measured by different methods to validate and monitor the accuracy of our method.

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AlanDeğerDil
dc.contributor.authorHasar, Ugur Cem
dc.contributor.authorKaya, Yunus
dc.contributor.authorOzturk, Gokhan
dc.contributor.authorErtugrul, Mehmet
dc.date.accessioned2026-10-29T19:08:51.729515037Z
dc.date.available2026-10-29T19:08:51.729515037Z
dc.date.issued2020
dc.description.abstractWe propose a simple method for determination of forward and backward propagation constants of nonreciprocal uniform networks or lines with asymmetric reflections. The wave cascading matrix presentation is used to diagonalize and decompose the line in terms of impedance and amplitude/phase transitions. The proposed method uses scattering parameters of the line/network connection and the thru connection, thus eliminating errors arising from fabrication tolerance and thickness of the second line. Besides, compared with conventional methods which necessitate calibration techniques such as the thru-reflect-line, our method has the advantage that it determines propagation constants without resorting the measurement of any reciprocal reflective standard. Propagation constant measurements of a reciprocal network (different-length X-band waveguide straights) and a nonreciprocal network (microwave phase shifter) were first carried out and then compared with those measured by different methods to validate and monitor the accuracy of our method.
dc.identifier.articlenumber108126
dc.identifier.doi10.1016/j.measurement.2020.108126
dc.identifier.eissn1873-412X
dc.identifier.issn0263-2241
dc.identifier.scopus2-s2.0-85087773007
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/bayburt/11841
dc.identifier.volume165
dc.identifier.wosWOS:000575757600009
dc.language.isoen
dc.publisherElsevier B.V.
dc.relation.ispartofMeasurement: Journal of the International Measurement Confederation
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectAsymmetric reflections
dc.subjectNonreciprocal uniform network/line
dc.subjectPropagation constant
dc.subjectWave cascading matrix
dc.subject.classificationEngineering, Multidisciplinary
dc.subject.classificationInstruments & Instrumentation
dc.subject.classificationEngineering
dc.subject.otherMeasurement
dc.subject.otherAsymmetric reflections
dc.subject.otherCalibration techniques
dc.subject.otherConventional methods
dc.subject.otherFabrication tolerances
dc.subject.otherForward-and-backward
dc.subject.otherMicrowave phase shifters
dc.subject.otherNonreciprocal networks
dc.subject.otherPropagation constant
dc.subject.otherScattering parameters
dc.titlePropagation constant measurements of reflection-asymmetric and nonreciprocal microwave networks from S-parameters without using a reflective standard
dc.typeArticle
rdl.citation.openalex11
rdl.citation.scopus13
rdl.citation.wos12
rdl.oa.statusclosed
rdl.oa.statusgreen
rdl.oa.urlhttp://hdl.handle.net/20.500.12403/3637
rdl.scopus.quartileQ1
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)