Hasar, Ugur Cem; Korkmaz, Huseyin; Kaya, Yunus; Iliev, Teodor

An attractive microwave free-space method is proposed for permittivity extraction of soil samples using calibration-free time-domain measurements. Different from other similar methods in the literature which use the layer-stripping approach in the forward direction in the extraction process, its formalism is based on the layer-stripping approach in the backward direction, whereby allowing extraction of permittivity from interfacial reflection coefficient only without resorting to any thickness information, especially useful for time-domain analysis of multilayer structures having multiple reflection terms. Effects of angle misalignment, loss, and surface roughness on the extraction performance of the proposed method (PM) are analyzed by numerical examples. Permittivity measurements of three low-loss flat solid samples [polypropylene (PP), polyethylene (PE), and polyoxymethylene (POM)] were first performed by a free-space setup operating over 1–18-GHz frequency range to validate our methodology and compare its accuracy against other similar methods in the literature. Thereafter, permittivity measurements of two soil samples sieved with similar and different sizes (coarse- and fine-grained soil samples) by the same free-space setup were then considered to assess the applicability and performance of our method for electromagnetic property analysis of homogeneous and partially inhomogeneous soil samples.

AtıfScopus9·WoS6·OpenAlex8

İncele

Hasar, Ugur Cem; Kaya, Yunus; Ozturk, Hamdullah; Izginli, Mucahit; Barroso, Joaquim Jose; Ramahi, Omar M.; Ertugrul, Mehmet

A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.

AtıfScopus48·WoS42·OpenAlex43

İncele