Microwave method for reference-plane-invariant and thickness-independent permittivity determination of liquid materials

MakaleAçık ErişimScopus SJRQ1

Özet

An attractive transmission-reflection method based on reference-plane invariant and thickness-independent expressions has been proposed for accurate and unique retrieval of complex permittivity of dielectric liquid samples. The method uses both branch-index-independent expressions and a restricted solution set for determining unique and fast complex permittivities. A 2D graphical method has been applied to demonstrate the operation and validation of the proposed method. A uncertainty analysis has been performed to monitor how the accuracy of the proposed method can be improved by a correct selection of sample holder properties. Scattering parameter measurements of two tested reference liquids (distilled water and methanol) have been carried out for comparison of various techniques with the proposed one when the reference-planes and sample thickness are not precisely known. We note from the comparison that whereas other techniques are seriously affected by imprecise knowledge of both reference-planes and sample thickness, the proposed method removes this restriction.

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https://doi.org/10.1063/1.4862047Yayıncı resmi DOI adresi
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AlanDeğerDil
dc.contributor.authorHasar, U.C.
dc.contributor.authorKaya, Y.
dc.contributor.authorBute, M.
dc.contributor.authorBarroso, J.J.
dc.contributor.authorErtugrul, M.
dc.date.accessioned2026-10-29T19:09:24.483530746Z
dc.date.available2026-10-29T19:09:24.483530746Z
dc.date.issued2014
dc.description.abstractAn attractive transmission-reflection method based on reference-plane invariant and thickness-independent expressions has been proposed for accurate and unique retrieval of complex permittivity of dielectric liquid samples. The method uses both branch-index-independent expressions and a restricted solution set for determining unique and fast complex permittivities. A 2D graphical method has been applied to demonstrate the operation and validation of the proposed method. A uncertainty analysis has been performed to monitor how the accuracy of the proposed method can be improved by a correct selection of sample holder properties. Scattering parameter measurements of two tested reference liquids (distilled water and methanol) have been carried out for comparison of various techniques with the proposed one when the reference-planes and sample thickness are not precisely known. We note from the comparison that whereas other techniques are seriously affected by imprecise knowledge of both reference-planes and sample thickness, the proposed method removes this restriction.
dc.identifier.articlenumber014705
dc.identifier.doi10.1063/1.4862047
dc.identifier.eissn1089-7623
dc.identifier.issn1089-7623
dc.identifier.issue1
dc.identifier.pmid24517796
dc.identifier.scopus2-s2.0-84893875635
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/bayburt/12291
dc.identifier.volume85
dc.identifier.wosWOS:000331217300059
dc.language.isoen
dc.publisherAMER INST PHYSICS
dc.relation.ispartofReview of Scientific Instruments
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subject.classificationInstruments & Instrumentation
dc.subject.classificationPhysics, Applied
dc.subject.classificationPhysics
dc.subject.otherDielectric liquids
dc.subject.otherScattering parameters
dc.subject.otherUncertainty analysis
dc.subject.otherComplex permittivity
dc.subject.otherDistilled water
dc.subject.otherGraphical methods
dc.subject.otherImprecise knowledge
dc.subject.otherLiquid materials
dc.subject.otherMicrowave methods
dc.subject.otherSample thickness
dc.subject.otherScattering parameter measurement
dc.subject.otherPermittivity
dc.titleMicrowave method for reference-plane-invariant and thickness-independent permittivity determination of liquid materials
dc.typeArticle
rdl.citation.openalex21
rdl.citation.scopus20
rdl.citation.wos20
rdl.departmentDepartment of Electrical and Electronics Engineering, University of Gaziantep, 27310 Gaziantep, Turkey
rdl.departmentDepartment of Electricity and Energy, Bayburt University, Bayburt 69000, Turkey
rdl.departmentAssociated Plasma Laboratory, National Institute for Space Research, 12227-010 São José dos Campos, SP, Brazil
rdl.departmentCenter for Research and Application of Nanoscience and Nanoengineering, Ataturk University, 25240 Erzurum, Turkey
rdl.oa.statusclosed
rdl.oa.statusgreen
rdl.oa.urlhttps://hdl.handle.net/20.500.12403/825
rdl.scopus.quartileQ1
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.source.indexPUBMED
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)