2026-10-29T23:52:30Zhttps://bayburt-rdlopen.rawdatalibrary.net/oai/request

oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/138062026-10-29T19:52:18Zopenairecom_bayburt_10000col_bayburt_10001com_bayburt_10010col_bayburt_10224

Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency bandHasar, U.C.Barroso, J.J.Kaya, Y.Bute, M.Ertugrul, M.low-loss samplesmaterials testingmicrowave measurementspermittivityIn this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods.VSP BV2014Articlehttps://rdlopen.rawdatalibrary.net/r/bayburt/13806https://doi.org/10.1080/09205071.2014.8962270920-5071enJournal of Electromagnetic Waves and Applicationsinfo:eu-repo/semantics/closedAccessinfo:eu-repo/semantics/articlehttps://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/13806