2026-10-29T23:33:58Zhttps://bayburt-rdlopen.rawdatalibrary.net/oai/requestoai:bayburt-rdlopen.rawdatalibrary.net:bayburt/133842026-10-29T19:52:14Zopenairedrivercom_bayburt_10000col_bayburt_10001com_bayburt_10010col_bayburt_10224Parameter Retrieval of Samples on a Substrate from Reflection-Only Waveguide MeasurementsHasar, Ugur CemOzturk, HamdullahKaya, YunusIzginli, MucahitErtugrul, MehmetComplex permeabilitycomplex permittivityknown substratenoniterativereflection-onlyA microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air-and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.Institute of Electrical and Electronics Engineers Inc.2021Articlehttps://rdlopen.rawdatalibrary.net/r/bayburt/13384https://doi.org/10.1109/lmwc.2020.30466971531-1309enIEEE Microwave and Wireless Components Lettersinfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/articlehttps://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/13384