<?xml version="1.0" encoding="UTF-8"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-10-30T05:18:56Z</responseDate><request verb="GetRecord" identifier="oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/12150" metadataPrefix="oai_dc">https://bayburt-rdlopen.rawdatalibrary.net/oai/request</request><GetRecord><record><header><identifier>oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/12150</identifier><datestamp>2026-10-29T19:42:14Z</datestamp><setSpec>openaire</setSpec><setSpec>com_bayburt_10000</setSpec><setSpec>col_bayburt_10001</setSpec><setSpec>com_bayburt_10010</setSpec><setSpec>col_bayburt_10224</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:title>Graphical Method for Examining Complex Natural Frequencies of Dispersive Materials</dc:title><dc:creator>Hasar, Ugur C.</dc:creator><dc:creator>Ozturk, Gokhan</dc:creator><dc:creator>Barroso, Joaquim J.</dc:creator><dc:creator>Gurbuz, Tolga U.</dc:creator><dc:creator>Kaya, Yunus</dc:creator><dc:creator>Ertugrul, Mehmet</dc:creator><dc:subject>Debye and Lorentz models</dc:subject><dc:subject>frequency-domain</dc:subject><dc:subject>graphical method</dc:subject><dc:subject>solution pattern</dc:subject><dc:subject>time-domain</dc:subject><dc:description>A graphical method is extended to and applied for visual inspection of solution patterns (region of complex natural frequencies sₙ) in the complexs-plane for dispersive materials characterized by the Debye and Lorentz models. These patterns are in the form of exponential decay and C-shaped profiles for the Debye and Lorentz models, respectively. Their forms are observed to be affected (e.g., moving left/right) in different manners with a variation of dispersion parameters. This method, thanks to its visual inspection capability, can help in analyzing/synthesizing filters and frequency-selective surfaces.</dc:description><dc:publisher>Institute of Electrical and Electronics Engineers Inc.</dc:publisher><dc:date>2021</dc:date><dc:type>Article</dc:type><dc:identifier>https://rdlopen.rawdatalibrary.net/r/bayburt/12150</dc:identifier><dc:identifier>https://doi.org/10.1109/lmwc.2021.3062584</dc:identifier><dc:identifier>1531-1309</dc:identifier><dc:language>en</dc:language><dc:relation>IEEE Microwave and Wireless Components Letters</dc:relation><dc:rights>info:eu-repo/semantics/closedAccess</dc:rights><dc:type>info:eu-repo/semantics/article</dc:type><dc:identifier>https://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/12150</dc:identifier></oai_dc:dc></metadata></record></GetRecord></OAI-PMH>