<?xml version="1.0" encoding="UTF-8"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-10-30T01:53:14Z</responseDate><request verb="GetRecord" identifier="oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/11989" metadataPrefix="oai_dc">https://bayburt-rdlopen.rawdatalibrary.net/oai/request</request><GetRecord><record><header><identifier>oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/11989</identifier><datestamp>2026-10-29T19:42:02Z</datestamp><setSpec>openaire</setSpec><setSpec>driver</setSpec><setSpec>com_bayburt_10000</setSpec><setSpec>col_bayburt_10001</setSpec><setSpec>com_bayburt_10010</setSpec><setSpec>col_bayburt_10224</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:title>Calibration-Free Time-Domain Free-Space Permittivity Extraction Technique</dc:title><dc:creator>Hasar, Ugur C.</dc:creator><dc:creator>Ozturk, Gokhan</dc:creator><dc:creator>Kaya, Yunus</dc:creator><dc:creator>Ertugrul, Mehmet</dc:creator><dc:subject>Free-space</dc:subject><dc:subject>permittivity</dc:subject><dc:subject>reflection</dc:subject><dc:subject>time-domain</dc:subject><dc:description>A time-domain free-space technique has been proposed to extract relative permittivity ( _r ) and effective conductivity ( σ _e ) of low-loss dielectric samples using their metal- and air-backed calibration-free reflected powers. Numerical computations and 3-D electromagnetic simulations were performed to validate the method. A sensitivity analysis was carried out to examine its accuracy. Calibration-free time-domain free-space measurements over 1-12 GHz were conducted by VNA to extract _r and σ _e of polyethylene and polypropylene low-loss samples.</dc:description><dc:publisher>Institute of Electrical and Electronics Engineers Inc.</dc:publisher><dc:date>2022</dc:date><dc:type>Article</dc:type><dc:identifier>https://rdlopen.rawdatalibrary.net/r/bayburt/11989</dc:identifier><dc:identifier>https://doi.org/10.1109/tap.2021.3121133</dc:identifier><dc:identifier>0018-926X</dc:identifier><dc:language>en</dc:language><dc:relation>IEEE Transactions on Antennas and Propagation</dc:relation><dc:rights>info:eu-repo/semantics/openAccess</dc:rights><dc:type>info:eu-repo/semantics/article</dc:type><dc:identifier>https://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/11989</dc:identifier></oai_dc:dc></metadata></record></GetRecord></OAI-PMH>