<?xml version="1.0" encoding="UTF-8"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-10-30T00:49:04Z</responseDate><request verb="GetRecord" identifier="oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/11397" metadataPrefix="oai_dc">https://bayburt-rdlopen.rawdatalibrary.net/oai/request</request><GetRecord><record><header><identifier>oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/11397</identifier><datestamp>2026-10-29T19:41:35Z</datestamp><setSpec>openaire</setSpec><setSpec>com_bayburt_10000</setSpec><setSpec>col_bayburt_10001</setSpec><setSpec>com_bayburt_10010</setSpec><setSpec>col_bayburt_10224</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:title>Reference-Invariant Permittivity Determination of Low-Loss Solid Dielectric Samples Using Spectral Free-Space Measurements Without Prior Thickness</dc:title><dc:creator>Hasar, Ugur C.</dc:creator><dc:creator>Ali, Husain</dc:creator><dc:creator>Kaya, Yunus</dc:creator><dc:subject>Closed-form expression</dc:subject><dc:subject>free-space</dc:subject><dc:subject>permittivity</dc:subject><dc:subject>reference-plane-independent</dc:subject><dc:subject>state transition matrix</dc:subject><dc:subject>thickness-invariant</dc:subject><dc:description>An extraction method has been proposed for relative permittivity determination εrs of low-loss solid dielectric samples using free-space measurements. It relies on a reference-plane invariant expression with no thickness information a priori, making resistant to conventional free-space measurement errors which may arise from improper information of sample position and thickness. In addition, the method constructed by the state transition matrix (STM) uses closed-form expressions – a feature distinguishes our method from previous STM-based extraction methods requiring a numerical tool or optimization procedure. Furthermore, provided that the sample thickness L is evaluated, as a by-product, first using the derived closed-form objective function away from any thickness-resonance region, the proposed method then determines εrs and L free from thickness-resonance effect, which otherwise can introduce ripples around or at the thickness-resonance frequency. Numerical analysis is performed to validate and assess the performance of our method. Free-space measurements at X-band of two low-loss samples with substantial thickness are performed for validation and accuracy comparison of our method against other similar methods.</dc:description><dc:publisher>Institute of Electrical and Electronics Engineers Inc.</dc:publisher><dc:date>2026</dc:date><dc:type>Article</dc:type><dc:identifier>https://rdlopen.rawdatalibrary.net/r/bayburt/11397</dc:identifier><dc:identifier>https://doi.org/10.1109/tap.2026.3734368</dc:identifier><dc:identifier>0018-926X</dc:identifier><dc:language>en</dc:language><dc:relation>IEEE Transactions on Antennas and Propagation</dc:relation><dc:rights>info:eu-repo/semantics/closedAccess</dc:rights><dc:type>info:eu-repo/semantics/article</dc:type><dc:identifier>https://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/11397</dc:identifier></oai_dc:dc></metadata></record></GetRecord></OAI-PMH>