2026-10-29T23:33:58Zhttps://bayburt-rdlopen.rawdatalibrary.net/oai/request

oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/107992026-10-29T19:41:04Zopenairedrivercom_bayburt_10000col_bayburt_10001com_bayburt_10010col_bayburt_10224

Improved Method for Permittivity Determination of Dielectric Samples by Free-Space MeasurementsHasar, Ugur CemKaya, YunusOzturk, HamdullahIzginli, MucahitErtugrul, MehmetBarroso, Joaquim JoseRamahi, Omar M.Complex permittivitydeembedding techniquefree-spacegatinguncalibrated measurementsA new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2022Articlehttps://rdlopen.rawdatalibrary.net/r/bayburt/10799https://doi.org/10.1109/tim.2022.31539910018-9456enIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENTinfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/articlehttps://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/10799