2026-10-30T03:59:39Zhttps://bayburt-rdlopen.rawdatalibrary.net/oai/request

oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/107872026-10-29T19:41:04Zopenairecom_bayburt_10000col_bayburt_10001com_bayburt_10010col_bayburt_10224

Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain MeasurementsHasar, Ugur CemKaya, YunusOzturk, HamdullahIzginli, MucahitBarroso, Joaquim JoseRamahi, Omar M.Ertugrul, MehmetTime-domain analysisAntenna measurementsTransmission line measurementsPermittivity measurementThickness measurementTemperature measurementBroadband antennasComplex permittivityfree-spacemetal-backedreflection-onlythicknesstime-domainA free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2022Articlehttps://rdlopen.rawdatalibrary.net/r/bayburt/10787https://doi.org/10.1109/tgrs.2021.30907120196-2892enIEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSINGinfo:eu-repo/semantics/closedAccessinfo:eu-repo/semantics/articlehttps://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/10787