<?xml version="1.0" encoding="UTF-8"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-10-29T22:40:33Z</responseDate><request verb="GetRecord" identifier="oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/10766" metadataPrefix="oai_dc">https://bayburt-rdlopen.rawdatalibrary.net/oai/request</request><GetRecord><record><header><identifier>oai:bayburt-rdlopen.rawdatalibrary.net:bayburt/10766</identifier><datestamp>2026-10-29T19:41:11Z</datestamp><setSpec>openaire</setSpec><setSpec>com_bayburt_10000</setSpec><setSpec>col_bayburt_10001</setSpec><setSpec>com_bayburt_10010</setSpec><setSpec>col_bayburt_10224</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:title>Extraction Method for Unique Determination of Complex Permittivity From Graphical Analysis of Natural Frequencies</dc:title><dc:creator>Hasar, Ugur C.</dc:creator><dc:creator>Ozturk, Gokhan</dc:creator><dc:creator>Kaya, Yunus</dc:creator><dc:creator>Alfaqawi, Mona S. S.</dc:creator><dc:creator>Barroso, Joaquim Jose</dc:creator><dc:creator>Ertugrul, Mehmet</dc:creator><dc:creator>Ramahi, Omar M.</dc:creator><dc:subject>Graphical method</dc:subject><dc:subject>natural modes</dc:subject><dc:subject>parameter extraction</dc:subject><dc:subject>unique solution</dc:subject><dc:description>A time-domain free-space extraction procedure is proposed to uniquely determine the relative complex permittivity epsilon(r)(omega) based on two sets of natural frequencies of the metal- and air-backed dielectric samples. A graphical analysis is applied for evaluating whether unique epsilon(r)(omega) can be extracted using such natural frequencies. The method is numerically validated using two dielectric samples with different epsilon(omega) for the ideal case (no noise) and under the influence of noise with different signal-to-noise ratios (SNRs).</dc:description><dc:publisher>IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC</dc:publisher><dc:date>2023-09</dc:date><dc:type>Article</dc:type><dc:identifier>https://rdlopen.rawdatalibrary.net/r/bayburt/10766</dc:identifier><dc:identifier>https://doi.org/10.1109/tap.2023.3287398</dc:identifier><dc:identifier>0018-926X</dc:identifier><dc:language>en</dc:language><dc:relation>IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION</dc:relation><dc:rights>info:eu-repo/semantics/closedAccess</dc:rights><dc:type>info:eu-repo/semantics/article</dc:type><dc:identifier>https://bayburt-rdlopen.rawdatalibrary.net/tr/items/bayburt/10766</dc:identifier></oai_dc:dc></metadata></record></GetRecord></OAI-PMH>